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This paper analyzes the measurement error due to false positives of the Force Concept Inventory (FCI) focusing on four questions (Q.5, Q.6, Q.7, and Q.16). We determine whether or not a correct response to a given FCI question is a false positive using subquestions. Using the data of 1145 university students in Japan from 2015 to 2017, we find that the sum of the systematic error from the false positives of Q.5, Q.6, Q.7, and Q.16 is about 10% of the FCI score of a mid-level student. We consider what degree the error influences the measures of the effectiveness of a course, namely, the average normalized gain and Cohens' d. Using a set of simulated data, we show that Cohens' d is less sensitive to the systematic error due to false positives than the average normalized gain.
Journal of Physics: Conference Series: Volume 1287, Issue 1, Pages 012033
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Record Link
<a href="https://www.per-central.org/items/detail.cfm?ID=15989">Yasuda, J, N. Mae, M. Hull, and M. Taniguchi. "Analyzing the measurement error from false positives in the Force Concept Inventory." J. Phys. Conf. Ser. 1287, no. 1, (August 21, 2019): 012033.</a>
AIP Format
J. Yasuda, N. Mae, M. Hull, and M. Taniguchi, , J. Phys. Conf. Ser. 1287 (1), 012033 (2019), WWW Document, (https://doi.org/10.1088/1742-6596/1287/1/012033).
AJP/PRST-PER
J. Yasuda, N. Mae, M. Hull, and M. Taniguchi, Analyzing the measurement error from false positives in the Force Concept Inventory, J. Phys. Conf. Ser. 1287 (1), 012033 (2019), <https://doi.org/10.1088/1742-6596/1287/1/012033>.
APA Format
Yasuda, J., Mae, N., Hull, M., & Taniguchi, M. (2019, August 21). Analyzing the measurement error from false positives in the Force Concept Inventory. J. Phys. Conf. Ser., 1287(1), 012033. Retrieved October 15, 2024, from https://doi.org/10.1088/1742-6596/1287/1/012033
Chicago Format
Yasuda, J, N. Mae, M. Hull, and M. Taniguchi. "Analyzing the measurement error from false positives in the Force Concept Inventory." J. Phys. Conf. Ser. 1287, no. 1, (August 21, 2019): 012033, https://doi.org/10.1088/1742-6596/1287/1/012033 (accessed 15 October 2024).
MLA Format
Yasuda, Jun-ichiro, Naohiro Mae, Michael Hull, and Masa-aki Taniguchi. "Analyzing the measurement error from false positives in the Force Concept Inventory." J. Phys. Conf. Ser. 1287.1 (2019): 012033. 15 Oct. 2024 <https://doi.org/10.1088/1742-6596/1287/1/012033>.
BibTeX Export Format
@article{
Author = "Jun-ichiro Yasuda and Naohiro Mae and Michael Hull and Masa-aki Taniguchi",
Title = {Analyzing the measurement error from false positives in the Force Concept Inventory},
Journal = {J. Phys. Conf. Ser.},
Volume = {1287},
Number = {1},
Pages = {012033},
Month = {August},
Year = {2019}
}
Refer Export Format
%A Jun-ichiro Yasuda %A Naohiro Mae %A Michael Hull %A Masa-aki Taniguchi %T Analyzing the measurement error from false positives in the Force Concept Inventory %J J. Phys. Conf. Ser. %V 1287 %N 1 %D August 21, 2019 %P 012033 %U https://doi.org/10.1088/1742-6596/1287/1/012033 %O application/pdf
EndNote Export Format
%0 Journal Article %A Yasuda, Jun-ichiro %A Mae, Naohiro %A Hull, Michael %A Taniguchi, Masa-aki %D August 21, 2019 %T Analyzing the measurement error from false positives in the Force Concept Inventory %J J. Phys. Conf. Ser. %V 1287 %N 1 %P 012033 %8 August 21, 2019 %U https://doi.org/10.1088/1742-6596/1287/1/012033 Disclaimer: ComPADRE offers citation styles as a guide only. We cannot offer interpretations about citations as this is an automated procedure. Please refer to the style manuals in the Citation Source Information area for clarifications.
Citation Source Information
The AIP Style presented is based on information from the AIP Style Manual. The AJP/PRST-PER presented is based on the AIP Style with the addition of journal article titles and conference proceeding article titles. The APA Style presented is based on information from APA Style.org: Electronic References. The Chicago Style presented is based on information from Examples of Chicago-Style Documentation. The MLA Style presented is based on information from the MLA FAQ. |
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